English | 275 pages | ISBN-10: 3527322884 | PDF | 6.28 MB
An up-to-date overview of the different x-ray based methods in the hot fields of nanoscience and nanotechnology, including methods for imaging nanomaterials, as well as for probing the electronic structure of nanostructured materials in order to investigate their different properties. Written by authors at one of the world's top facilities working with these methods, this monograph presents and discusses techniques and applications in the fields of x-ray scattering, spectroscopy and microscope imaging.
The resulting systematic collection of these advanced tools will benefit graduate students, postdocs as well as professional researchers.
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